- New

Reference : 09057-10
X-ray goniometer equipped with two independent stepper motors for precise angular positioning of the sample and detector. Featuring a self-calibration system and automatic recognition, it ensures intuitive operation and accurate positioning for X-ray diffraction and crystallographic analysis experiments.
The XR 4.0 X-ray goniometer is a precision angular positioning device designed for X-ray diffraction experiments and the investigation of crystallographic properties of materials. It features two independently operating stepper motors, enabling precise movement of the sample and detector according to different experimental configurations.
A range of complementary accessories extends the experimental capabilities of the XR 4.0 goniometer and optimizes its use in diffraction and material analysis applications.
| Reference | Experiment Title |
|---|---|
| P2540105 | Characteristic X-rays of Copper |
| P2540205 | Characteristic X-rays of Molybdenum |
| P2540305 | Characteristic X-rays of Iron |
| P2540405 | Intensity of Characteristic X-rays as a Function of Anode Current and Anode Voltage |
| P2540505 | Monochromatization of Molybdenum X-rays |
| P2540605 | Monochromatization of Copper X-rays |
| P2540705 | Kα Doublet Splitting of Molybdenum X-rays and Fine Structure |
| P2540805 | Kα Doublet Splitting of Iron X-rays and Fine Structure |
| P2540905 | Duane-Hunt Displacement Law and Planck's Quantum of Action |
| P2541005 | Characteristic X-ray Lines of Different Anode Materials and Moseley's Law |
| P2541105 | Absorption of X-rays |
| P2541205 | K and L Absorption Edges of X-rays, Moseley's Law and the Rydberg Constant |
| P2541305 | Examination of NaCl Single-Crystal Structure with Different Orientations |
| P2541705 | Compton Scattering of X-rays |
| P2542105 | Debye-Scherrer Diffraction Patterns of Powder Samples with Three Cubic Bravais Lattices (Bragg-Brentano Geometry) |
| P2542205 | Debye-Scherrer Diffraction Patterns of Powder Samples with a Diamond Structure (Bragg-Brentano Geometry) |
| P2542305 | Debye-Scherrer Diffraction Patterns of Powder Samples with a Hexagonal Crystal Structure |
| P2542405 | Debye-Scherrer Diffraction Patterns of Powder Samples with a Tetragonal Crystal Structure |
| P2542505 | Debye-Scherrer Diffraction Patterns of a Cubic Powder Sample |
| P2542605 | Measurement of Debye-Scherrer Reflection Intensities Using a Cubic Powder Sample |
| P2542705 | Debye-Scherrer Diffraction Measurements for Investigating the Texture of Rolled Sheets |
| P2542805 | Characteristic X-rays of Tungsten |
| P2544005 | X-ray Energy Spectroscopy – Calibration of the X-ray Energy Detector |
| P2544105 | Energy Resolution of the X-ray Detector |
| P2544205 | Intrinsic Fluorescence Radiation of the X-ray Detector |
| P2544505 | Qualitative X-ray Fluorescence Spectroscopy of Metals – Moseley's Law |
| P2544605 | Qualitative X-ray Fluorescence Analysis of Alloyed Materials |
| P2544705 | Qualitative X-ray Fluorescence Analysis of Powder Samples |
| P2544805 | Qualitative X-ray Fluorescence Analysis of Solutions |
| P2544905 | Qualitative X-ray Fluorescence Analysis of Ore Samples |
| P2545005 | Quantitative X-ray Fluorescence Analysis of Alloyed Materials |
| P2545105 | Quantitative X-ray Fluorescence Analysis of Solutions |
| P2545205 | X-ray Fluorescence Spectroscopy – Layer Thickness Determination |
| P2546005 | Compton Effect – Energy-Dispersive Direct Measurement |
| P2546105 | Energy-Dispersive Measurements of K and L Absorption Edges |
| P2546205 | Determination of the Lattice Constants of a Single Crystal |
| P2546305 | Duane-Hunt Displacement Law |