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  • XR 4.0 X-ray Goniometer | Diffraction & Crystallography

09057-10 Goniometer for X-Ray Unit XR 4.0



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Reference : 09057-10




X-ray goniometer equipped with two independent stepper motors for precise angular positioning of the sample and detector. Featuring a self-calibration system and automatic recognition, it ensures intuitive operation and accurate positioning for X-ray diffraction and crystallographic analysis experiments.



Function and Applications

The XR 4.0 X-ray goniometer is a precision angular positioning device designed for X-ray diffraction experiments and the investigation of crystallographic properties of materials. It features two independently operating stepper motors, enabling precise movement of the sample and detector according to different experimental configurations.



Benefits and Main Features

  • Self-calibration: goniometer system featuring a self-calibration function to simplify commissioning and ensure precise positioning.
  • Plug & Measure: automatic recognition of the goniometer by the measurement system for quick and straightforward installation.
  • Independent positioning: goniometer block equipped with two independent stepper motors, allowing separate rotation of the sample holder and detector, as well as operation with a 2:1 angular coupling.
  • Detector holder: fitted with a slit aperture carrier for mounting slit holders and absorption foils. The aperture can be adjusted to modify angular resolution.
  • Safety system: light-barrier system limiting the permitted swivel range and protecting detectors against excessive angular movement.
  • Intuitive operation: direct control from the instrument or operation via a computer.



Technical Specifications

  • Angular step width: 0.1° to 10°
  • Movement speed: 0.5 to 100 s/step
  • Sample rotation range: 0° to 360°
  • Detector rotation range: –10° to +170°
  • Dimensions: 35 × 30 × 20 cm
  • Weight: 5 kg



Recommended Accessories

A range of complementary accessories extends the experimental capabilities of the XR 4.0 goniometer and optimizes its use in diffraction and material analysis applications.

  • 09056-01: XR 4.0 Potassium Bromide (KBr) Crystal
  • 09056-05: Mounted Lithium Fluoride (LiF) X-ray Crystal
  • 09058-02: Universal Crystal Holder for X-ray Unit
  • 09058-09: X-ray Powder Sample Holder for Diffractometry
  • 09058-36: X-ray Energy Detector (XRED)



Experiments with the XR 4.0 X-ray Goniometer

Reference Experiment Title
P2540105 Characteristic X-rays of Copper
P2540205 Characteristic X-rays of Molybdenum
P2540305 Characteristic X-rays of Iron
P2540405 Intensity of Characteristic X-rays as a Function of Anode Current and Anode Voltage
P2540505 Monochromatization of Molybdenum X-rays
P2540605 Monochromatization of Copper X-rays
P2540705 Kα Doublet Splitting of Molybdenum X-rays and Fine Structure
P2540805 Kα Doublet Splitting of Iron X-rays and Fine Structure
P2540905 Duane-Hunt Displacement Law and Planck's Quantum of Action
P2541005 Characteristic X-ray Lines of Different Anode Materials and Moseley's Law
P2541105 Absorption of X-rays
P2541205 K and L Absorption Edges of X-rays, Moseley's Law and the Rydberg Constant
P2541305 Examination of NaCl Single-Crystal Structure with Different Orientations
P2541705 Compton Scattering of X-rays
P2542105 Debye-Scherrer Diffraction Patterns of Powder Samples with Three Cubic Bravais Lattices (Bragg-Brentano Geometry)
P2542205 Debye-Scherrer Diffraction Patterns of Powder Samples with a Diamond Structure (Bragg-Brentano Geometry)
P2542305 Debye-Scherrer Diffraction Patterns of Powder Samples with a Hexagonal Crystal Structure
P2542405 Debye-Scherrer Diffraction Patterns of Powder Samples with a Tetragonal Crystal Structure
P2542505 Debye-Scherrer Diffraction Patterns of a Cubic Powder Sample
P2542605 Measurement of Debye-Scherrer Reflection Intensities Using a Cubic Powder Sample
P2542705 Debye-Scherrer Diffraction Measurements for Investigating the Texture of Rolled Sheets
P2542805 Characteristic X-rays of Tungsten
P2544005 X-ray Energy Spectroscopy – Calibration of the X-ray Energy Detector
P2544105 Energy Resolution of the X-ray Detector
P2544205 Intrinsic Fluorescence Radiation of the X-ray Detector
P2544505 Qualitative X-ray Fluorescence Spectroscopy of Metals – Moseley's Law
P2544605 Qualitative X-ray Fluorescence Analysis of Alloyed Materials
P2544705 Qualitative X-ray Fluorescence Analysis of Powder Samples
P2544805 Qualitative X-ray Fluorescence Analysis of Solutions
P2544905 Qualitative X-ray Fluorescence Analysis of Ore Samples
P2545005 Quantitative X-ray Fluorescence Analysis of Alloyed Materials
P2545105 Quantitative X-ray Fluorescence Analysis of Solutions
P2545205 X-ray Fluorescence Spectroscopy – Layer Thickness Determination
P2546005 Compton Effect – Energy-Dispersive Direct Measurement
P2546105 Energy-Dispersive Measurements of K and L Absorption Edges
P2546205 Determination of the Lattice Constants of a Single Crystal
P2546305 Duane-Hunt Displacement Law



09057-99

Data sheet

HS
90230010

Specific References

Download

09057-10 Operating Instructions

Download (250.82KB)