IT2800 Series - Graphical Source Measure Unit (SMU)
References
IT2801 Graphical Source Measure Unit (SMU) ±1000 V, ±1 A, ±20 W
IT2805 Graphical Source Measure Unit (SMU) ±200 V, ±1,5 A, ±20 W
IT2806 Graphical Source Measure Unit (SMU) ±200 V, ±3 A DC, ±10 A impulsions, ±20 W
IT2801R Graphical Source Measure Unit (SMU) ±1000 V, ±1 A, ±20 W, triaxial connector
IT2805R Graphical Source Measure Unit (SMU) ±200 V, ±1,5 A, ±20 W triaxial connector
IT2806R Graphical Source Measure Unit (SMU) ±200 V, ±3 A DC, ±10 A impulsions, ±20 W triaxial connector
The IT2800 Series is a next-generation Source Measure Unit (SMU) designed to deliver precision, versatility, and performance in a compact benchtop format. By integrating multiple test functions into a single instrument, it enables complete electrical characterization of electronic components with exceptional ease of use.
With true 4-quadrant sourcing and measuring capability, the IT2800 independently sources and measures voltage and current, ensuring highly accurate I–V characterization.
Covering an ultra-wide range from 10 fA to 10 A and 100 nV to 1000 V, the IT2800 supports both ultra-low current applications and high-voltage testing. Its advanced DC and pulsed measurement capabilities help minimize self-heating effects in the device under test (DUT), improving measurement reliability and accuracy.
The intuitive 5-inch touchscreen graphical user interface offers multiple display modes—including Graph View, Scope View, and Record View—significantly enhancing engineering productivity in both R&D and production environments.
Key Advantages
- 6-in-1 instrument integration: Voltage Source, Current Source, 6½-digit Digital Multimeter (DCV, DCI, Ohms), Battery Simulator, Electronic Load, and Pulse Generator
- True 4-quadrant sourcing and measurement capability
- Supports both 2-wire and 4-wire measurements
- High resolution up to 10 fA / 100 nV
- Multi-channel architecture with simultaneous and parallel testing capability
- Built-in resistance, power, and math measurement functions
- Front USB port for data storage, screen capture, and configuration import/export
- Comprehensive communication interfaces: USB, LAN, Digital I/O, with optional GPIB
Applications
- Discrete semiconductor device characterization
- Passive component testing
- Transient voltage suppression (TVS) devices and varistors
- Laser diodes
- Advanced electronic component testing in R&D and manufacturing environments
